reliability and failure mechanisms during R&D, Transfer (New Product Introduction or NPI) and High-Volume-Manufacturing (HVM). Design experiments and co-ordinate statistical studies to determine device reliability, for example gate oxide lifetime marathon test, time-dependent dielectric breakdown. Lead and collaborate with R&D, Engineering and … reliability testing of SiC MOSFETs and diodes, both at wafer- and package-level; preferred to have GaN experiences as well. A good understanding of statisticalanalysis and design of experiments. Knowledge of semiconductor TCAD tools for device simulation, i.e. Synopsys Sentaurus, Silvaco Victory. Background in electronics engineering for More ❯
reliability and failure mechanisms during R&D, Transfer (New Product Introduction or NPI) and High-Volume-Manufacturing (HVM). Design experiments and co-ordinate statistical studies to determine device reliability, for example gate oxide lifetime marathon test, time-dependent dielectric breakdown. Lead and collaborate with R&D, Engineering and … reliability testing of SiC MOSFETs and diodes, both at wafer- and package-level; preferred to have GaN experiences as well. A good understanding of statisticalanalysis and design of experiments Knowledge of semiconductor TCAD tools for device simulation, i.e. Synopsys Sentaurus, Silvaco Victory Background in electronics engineering for More ❯
reliability and failure mechanisms during R&D, Transfer (New Product Introduction or NPI) and High-Volume-Manufacturing (HVM). Design experiments and co-ordinate statistical studies to determine device reliability, for example gate oxide lifetime marathon test, time-dependent dielectric breakdown. Lead and collaborate with R&D, Engineering and … reliability testing of SiC MOSFETs and diodes, both at wafer- and package-level; preferred to have GaN experiences as well. A good understanding of statisticalanalysis and design of experiments Knowledge of semiconductor TCAD tools for device simulation, i.e. Synopsys Sentaurus, Silvaco Victory Background in electronics engineering for More ❯
reliability and failure mechanisms during R&D, Transfer (New Product Introduction or NPI) and High-Volume-Manufacturing (HVM). Design experiments and co-ordinate statistical studies to determine device reliability, for example gate oxide lifetime marathon test, time-dependent dielectric breakdown. Lead and collaborate with R&D, Engineering and … reliability testing of SiC MOSFETs and diodes, both at wafer- and package-level; preferred to have GaN experiences as well. A good understanding of statisticalanalysis and design of experiments Knowledge of semiconductor TCAD tools for device simulation, i.e. Synopsys Sentaurus, Silvaco Victory Background in electronics engineering for More ❯
